Optical properties of silicon nanocrystals embedded in a SiO2 matrix
Optical properties of isolated silicon nanocrystals (nc-Si) with a mean size of ∼4 nm embedded in a SiO2 matrix that was synthesized with an ion beam technique have been determined with spectroscopic ellipsometry in the photon energy range of 1.1–5.0 eV. The optical properties of the nc-Si are foun...
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Main Authors: | Ding, Liang, Chen, Tupei, Liu, Yang, Ng, Chi Yung, Fung, Stevenson Hon Yuen |
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其他作者: | School of Electrical and Electronic Engineering |
格式: | Article |
語言: | English |
出版: |
2010
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在線閱讀: | https://hdl.handle.net/10356/91319 http://hdl.handle.net/10220/6358 |
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