CMOS compatible dual metal gate integration with successful Vth adjustment on high-k HfTaON by high-temperature metal intermixing
10.1016/j.sse.2007.09.026
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Main Authors: | Ren, C., Chan, D.S.H., Loh, W.Y., Lo, G.Q., Balasubramanian, N., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/114494 |
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Institution: | National University of Singapore |
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