Investigation of V-defects formation in InGaN/GaN multiple quantum well grown on sapphire
10.1016/j.tsf.2006.07.181
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Main Authors: | Yong, A.M., Soh, C.B., Zhang, X.H., Chow, S.Y., Chua, S.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56409 |
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Institution: | National University of Singapore |
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