Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

10.1109/IRPS.2009.5173354

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書目詳細資料
Main Authors:	Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
主題:	Double lock-in Localized temperature Scanning thermal microscopy
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/71609
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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