Analytical damage tables for crystalline silicon

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

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Bibliographic Details
Main Authors: Chan, H.Y., Benistant, F., Srinivasan, M.P., Erlebach, A., Zechner, C.
Other Authors: CHEMICAL & BIOMOLECULAR ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/74487
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Institution: National University of Singapore

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