Effect of growth temperature on the epitaxy strain relaxation and the tilt of InxAl1-x As graded layer grown by solid-source molecular beam epitaxy
10.1088/0022-3727/45/50/505106
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Main Authors: | Loke, W.K., Tan, K.H., Wicaksono, S., Yoon, S.F., Owen, M.H.S., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82200 |
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Institution: | National University of Singapore |
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