Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1-x-y GexCy films
10.1016/S1369-8001(02)00037-9
Saved in:
Main Authors: | Feng, W., Choi, W.K., Bera, L.K., Ji, M., Yang, C.Y. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/84045 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Structural, electrical and optical studies on the effects of rapid thermal processing on silicon-germanium-carbon films
by: FENG WEI
Published: (2010) -
Indentifying assessment measures and interventions reported for Thai children with cerebral palsy using the ICF-CY framework
by: Pinnailug Tantilipikorn, et al.
Published: (2014) -
Hot-carrier effects in strained n-channel transistor with silicon-carbon (Si1-yCy) source/drain stressors and its orientation dependence
by: Ang, K.-W., et al.
Published: (2014) -
Crystal structure of arabidopsis thaliana cyclophilin 38 (AtCyP38)
by: DILEEP VASUDEVAN
Published: (2011) -
Applying the ICF-CY framework clarifies actual health management in Thai children with cerebral palsy in Central region
by: Pinailug Tantilipikorn, et al.
Published: (2014)