Strained channel transistor using strain field induced by source and drain stressors

Strained channel transistor using strain field induced by source and drain stressors

Materials Research Society Symposium Proceedings

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Bibliographic Details
Main Authors:	Yeo, Y.-C., Sun, J., Ong, E.H.
Other Authors:	MECHANICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84229
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Institution:	National University of Singapore

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