Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopy
10.1016/j.nimb.2005.01.098
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Main Authors: | Seng, H.L., Osipowicz, T., Zhang, J., Tok, E.S., Watt, F. |
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其他作者: | PHYSICS |
格式: | Conference or Workshop Item |
出版: |
2014
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在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/98665 |
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機構: | National University of Singapore |
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