Design and fabrication of insulated gate bipolar transistor (IGBT) using wafer bonding technology

With the enhanced performance of the novel Lateral IGBT can be proved through simulation, its fabrication remains a challenge. In this project, we investigated many different fabrication methodologies, and wafer bonding is found to be only viable choice.

Saved in:
Bibliographic Details
Main Authors: Tan, Cher Ming., Tse, Man Siu.
Other Authors: Tan, Cher Ming
Format: Research Report
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/2887
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University

Similar Items