TEM characterization of III-V diode structure grown on GeOI structures
A highly sensitive semiconductor device, avalanche photo diode, exploits photoelectric effect to convert light to electricity. APDs which can act like photo detectors provide a built-in first stage gain through avalanche multiplication. When the photo generated carriers acquire enough energy from th...
Saved in:
Main Author: | Myat Kyawt Ei. |
---|---|
Other Authors: | Ng Beng Koon |
Format: | Final Year Project |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/47700 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
InAs/GaAs quantum dots on germanium-on-insulator-on-silicon substrates (GeOI) using molecular beam epitaxy
by: Fitzgerald, Eugene A., et al.
Published: (2013) -
Characteristics of InAs/InGaAs/GaAs QDs on GeOI substrates with single-peak 1.3 µm room-temperature emission
by: Liang, Y. Y., et al.
Published: (2013) -
GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
by: Chen, Qimiao, et al.
Published: (2023) -
Photoluminescence studies of compound semiconductor structures grown by molecular beam epitaxy
by: Li, He Ming.
Published: (2009) -
Strain-relaxed GeSn-on-insulator (GeSnOI) microdisks
by: Burt, Daniel, et al.
Published: (2022)