Physical Insights Into the Mobility Enhancement in Amorphous InGaZnO Thin-Film Transistor by SiO2 Passivation Layer
Saved in:
Main Authors: | Panpan Zhang, Subhranu Samanta, Xuanyao Fong |
---|---|
Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Article |
Published: |
2024
|
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/249169 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Physical Insights Into the Mobility Enhancement in Amorphous InGaZnO Thin-Film Transistor by SiO<sub>2</sub> Passivation Layer
by: Zhang, Panpan, et al.
Published: (2023) -
InGaZnO thin-film transistors with coplanar control gates for single-device logic applications
by: Hu, Shaogang, et al.
Published: (2018) -
Bipolar resistive switching and synaptic characteristics modulation at sub-μA current level using novel Ni/SiO<sub>x</sub>/W cross-point structure
by: Samanta, Subhranu, et al.
Published: (2023) -
Transparent electronic and photoelectric synaptic transistors based on the combination of an InGaZnO channel and a TaOx gate dielectric
by: Li, Yuanbo, et al.
Published: (2023) -
Impact of Ti Interfacial Layer on Resistive Switching Characteristics at sub-μA Current Level in SiO<sub>x</sub>-Based Flexible Cross-Point RRAM
by: Samanta, Subhranu, et al.
Published: (2023)