Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurements
Semiconductor Science and Technology
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| Main Authors: | , , |
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| Other Authors: | |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62357 |
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| Institution: | National University of Singapore |