Full range workfunction tunning of MOSFETs using interfacial yttrium layer in fully germanided Ni gate

10.1149/1.2727410

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Bibliographic Details
Main Authors: Yu, H.P., Pey, K.L., Choi, W.K., Antoniadis, D.A., Fitzgerald, E.A., Dawood, M.K., Ow, K.Q., Chi, D.Z.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70390
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Institution: National University of Singapore

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