Modeling adhesive failure in electronic packages
10.1109/EPTC.2006.342812
Saved in:
Main Authors: | Chew, H.B., Guo, T.F., Cheng, L. |
---|---|
Other Authors: | MATERIALS SCIENCE AND ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73625 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Modeling adhesive failure in electronic packages
by: Chew, H.B., et al.
Published: (2014) -
Influence of nonuniform initial porosity distribution on adhesive failure in electronic packages
by: Chew, H.B., et al.
Published: (2014) -
Influence of non-uniform initial porosity distribution on adhesive failure in electronic packages
by: Chew, H.B., et al.
Published: (2014) -
Vapor pressure and residual stress effects on failure of an adhesive film
by: Chew, H.B., et al.
Published: (2014) -
Popcorn failure and unstable void growth in plastic electronic packages
by: Chong, C.W., et al.
Published: (2014)