Analysis of the variation in the field-dependent behavior of thermally oxidized tantalum oxide films
10.1063/1.356020
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Main Authors: | Choi, W.K., Ling, C.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80294 |
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Institution: | National University of Singapore |
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