Plasma etching optimization of oxide/nitride/oxide interpoly dielectric breakdown time in flash memory devices
10.1109/66.857949
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Main Authors: | Cha, C.L., Chor, E.F., Gong, H., Zhang, A.Q., Chan, L. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80991 |
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Institution: | National University of Singapore |
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