Interface traps at high doping drain extension region in sub-0.25-μm MOSTs
10.1109/55.919239
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Main Authors: | Chen, G., Li, M.F., Yu, X. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82558 |
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Institution: | National University of Singapore |
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