Combined generative adversarial network and fuzzy C-means clustering for multi-class voice disorder detection with an imbalanced dataset

by Chui, K.T., Lytras, M.D., Vasant, P.
Published 2020

A genetic algorithm optimized RNN-LSTM model for remaining useful life prediction of turbofan engine

by Chui, K.T., Gupta, B.B., Vasant, P.
Published 2021

Temperature dependence of magnetotransport properties of Ni80 Fe20 Fe50 Mn50 Ni80 Fe20 trilayers

by Chui, K.M., Tripathy, D., Adeyeye, A.O.
Published 2014

Detection of a single magnetic dot using a Planar Hall sensor

by Chui, K.M., Adeyeye, A.O., Li, M.-H.
Published 2014

Effect of seed layer on the sensitivity of exchange biased planar Hall sensor

by Chui, K.M., Adeyeye, A.O., Li, M.-H.
Published 2014

STI-induced damage and hot-carrier reliability in the narrow width short channel NMOSFET fabricated using global strained-Si technology

by Phua, W.H.T., Ang, D.S., Ling, C.H., Chui, K.J.
Published 2014

Experimental study on deflagration-to-detonation transition enhancement methods in a PDE

by New, T.H., Panicker, P.K., Chui, K.F., Tsai, H.M., Lu, F.K.
Published 2014

Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors

by Ang, K.-W., Chui, K.-J., Tung, C.-H., Samudra, G., Balasubramanian, N., Yeo, Y.-C.
Published 2014

Performance enhancement in uniaxial strained silicon-on-insulator N-MOSFETs featuring silicon-carbon source/drain regions

by Ang, K.-W., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Samudra, G.S., Yeo, Y.-C.
Published 2014

n-MOSFET with silicon-carbon source/drain for enhancement of carrier transport

by Chui, K.-J., Ang, K.-W., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
Published 2014

Carrier backscattering characteristics of strained N-MOSFET featuring silicon-carbon source/drain regions

by Ang, K.-W., Chin, H.-C., Chui, K.-J., Li, M.-F., Samudra, G., Yeo, Y.-C.
Published 2014

Carrier backscattering characteristics of strained silicon-on-insulator n-MOSFETs featuring silicon-carbon source/drain regions

by Ang, K.-W., Chin, H.-C., Chui, K.-J., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
Published 2014

Enhanced strain effects in 25-nm gate-length thin-body nMOSFETs with silicon-carbon source/drain and tensile-stress liner

by Ang, K.-W., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
Published 2014

Enhanced performance in 50 nm N-MOSFETs with silicon-carbon source/drain regions

by Ang, K.W., Chui, K.J., Bliznetsov, V., Du, A., Balasubramanian, N., Li, M.F., Samudra, G., Yeo, Y.-C.
Published 2014

SDODEL MOSFET for performance enhancement

by Chui, K.J., Samudra, G.S., Yeo, Y.-C., Tee, K.-C., Leong, K.-W., Tee, K.M., Benistant, F., Chan, L.
Published 2014

Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors

by Ang, K.-W., Wan, C., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G., Yeo, Y.-C.
Published 2014

Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors

by Ang, K.-W., Chui, K.-J., Bliznetsov, V., Tung, C.-H., Du, A., Balasubramanian, N., Samudra, G., Li, M.F., Yeo, Y.-C.
Published 2014

Sub-30nm strained p-channel fin-type field-effect transistors with condensed SiGe source/drain stressors

by Tan, K.-M., Liow, T.-Y., Lee, R.T.P., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Samudra, G.S., Yoo, W.-J., Yeo, Y.-C.
Published 2014

Strained thin-body p-MOSFET with condensed silicon-germanium source/ drain for enhanced drive current performance

by Ang, K.-W., Chui, K.-J., Madan, A., Wong, L.-Y., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
Published 2014

Process-induced strained P-MOSFET featuring nickel-platinum silicided source/drain

by Lee, R.T.P., Liow, T.-Y., Tan, K.-M., Ang, K.-W., Chui, K.-J., Guo, Q.-L., Samudra, G., Chi, D.-Z., Yeo, Y.-C.
Published 2014