Temperature dependence of magnetotransport properties of Ni80 Fe20 Fe50 Mn50 Ni80 Fe20 trilayers

由 Chui, K.M., Tripathy, D., Adeyeye, A.O.
出版 2014

Detection of a single magnetic dot using a Planar Hall sensor

由 Chui, K.M., Adeyeye, A.O., Li, M.-H.
出版 2014

Effect of seed layer on the sensitivity of exchange biased planar Hall sensor

由 Chui, K.M., Adeyeye, A.O., Li, M.-H.
出版 2014

STI-induced damage and hot-carrier reliability in the narrow width short channel NMOSFET fabricated using global strained-Si technology

由 Phua, W.H.T., Ang, D.S., Ling, C.H., Chui, K.J.
出版 2014

Experimental study on deflagration-to-detonation transition enhancement methods in a PDE

由 New, T.H., Panicker, P.K., Chui, K.F., Tsai, H.M., Lu, F.K.
出版 2014

n-MOSFET with silicon-carbon source/drain for enhancement of carrier transport

由 Chui, K.-J., Ang, K.-W., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
出版 2014

Performance enhancement in uniaxial strained silicon-on-insulator N-MOSFETs featuring silicon-carbon source/drain regions

由 Ang, K.-W., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Samudra, G.S., Yeo, Y.-C.
出版 2014

Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors

由 Ang, K.-W., Chui, K.-J., Tung, C.-H., Samudra, G., Balasubramanian, N., Yeo, Y.-C.
出版 2014

Carrier backscattering characteristics of strained N-MOSFET featuring silicon-carbon source/drain regions

由 Ang, K.-W., Chin, H.-C., Chui, K.-J., Li, M.-F., Samudra, G., Yeo, Y.-C.
出版 2014

Carrier backscattering characteristics of strained silicon-on-insulator n-MOSFETs featuring silicon-carbon source/drain regions

由 Ang, K.-W., Chin, H.-C., Chui, K.-J., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
出版 2014

Enhanced strain effects in 25-nm gate-length thin-body nMOSFETs with silicon-carbon source/drain and tensile-stress liner

由 Ang, K.-W., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
出版 2014

Enhanced performance in 50 nm N-MOSFETs with silicon-carbon source/drain regions

由 Ang, K.W., Chui, K.J., Bliznetsov, V., Du, A., Balasubramanian, N., Li, M.F., Samudra, G., Yeo, Y.-C.
出版 2014

Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors

由 Ang, K.-W., Wan, C., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G., Yeo, Y.-C.
出版 2014

SDODEL MOSFET for performance enhancement

由 Chui, K.J., Samudra, G.S., Yeo, Y.-C., Tee, K.-C., Leong, K.-W., Tee, K.M., Benistant, F., Chan, L.
出版 2014

Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors

由 Ang, K.-W., Chui, K.-J., Bliznetsov, V., Tung, C.-H., Du, A., Balasubramanian, N., Samudra, G., Li, M.F., Yeo, Y.-C.
出版 2014

Sub-30nm strained p-channel fin-type field-effect transistors with condensed SiGe source/drain stressors

由 Tan, K.-M., Liow, T.-Y., Lee, R.T.P., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Samudra, G.S., Yoo, W.-J., Yeo, Y.-C.
出版 2014

Strained thin-body p-MOSFET with condensed silicon-germanium source/ drain for enhanced drive current performance

由 Ang, K.-W., Chui, K.-J., Madan, A., Wong, L.-Y., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G.S., Yeo, Y.-C.
出版 2014

Process-induced strained P-MOSFET featuring nickel-platinum silicided source/drain

由 Lee, R.T.P., Liow, T.-Y., Tan, K.-M., Ang, K.-W., Chui, K.-J., Guo, Q.-L., Samudra, G., Chi, D.-Z., Yeo, Y.-C.
出版 2014

Thin body silicon-on-insulator N-MOSFET with silicon-carbon source/drain regions for performance enhancement

由 Ang, K.-W., Chui, K.-J., Bliznetsov, V., Wang, Y., Wong, L.-Y., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G., Yeo, Y.-C.
出版 2014

50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner

由 Ang, K.-W., Chui, K.-J., Chin, H.-C., Foo, Y.-L., Du, A., Deng, W., Li, M.-F., Samudra, G., Balasubramanian, N., Yeo, Y.-C.
出版 2014