Investigation and optimization of in-process dressing of chemical mechanical polishing

Chemical Mechanical Polishing (CMP) is the technique known to provide global planarization of topography with low post planarization slope and it is a technique to planarize the dielectric layers, which insulate the multilevel interconnect and it can reduces the topography over layer scales the conv...

Full description

Saved in:
Bibliographic Details
Main Author: Zaw Moe Aung
Other Authors: Butler, David Lee
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5510
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University

Similar Items