Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicides

The formation of Ni silicides has been successfully monitored by Raman spectroscopy. Ni silicides formed at different annealing temperatures using rapid thermal annealing were analyzed using Rutherford backscattering spectroscopy and X-ray diffraction. Raman spectroscopy was further us...

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Bibliographic Details
Main Authors: Mangelinck, D., Osipowicz, T., See, A., Lee, Pooi See, Pey, Kin Leong, Shen, Zexiang, Ding, Jun
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/94700
http://hdl.handle.net/10220/8060
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Institution: Nanyang Technological University
Language: English

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