SIMULATION OF DIELECTRIC BREAKDOWN : NUMERICAL TECHNIQUES AND A NEW MODEL

SIMULATION OF DIELECTRIC BREAKDOWN : NUMERICAL TECHNIQUES AND A NEW MODEL

Master's

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	LAU HUI CHENG
مؤلفون آخرون:	DEPT OF COMPUTATIONAL SCIENCE
التنسيق:	Theses and Dissertations
منشور في:	2019
الوصول للمادة أونلاين:	https://scholarbank.nus.edu.sg/handle/10635/160037
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

SIMULATION OF DIELECTRIC BREAKDOWN : NUMERICAL TECHNIQUES AND A NEW MODEL
بواسطة: LAU HUI CHENG
منشور في: (2019)

GATE DIELECTRIC BREAKDOWN PHYSICAL ANALYSIS AND STUDIES -2D MODELING OF BREAKDOWN THERMAL EFFECT
بواسطة: KHO SING TZE
منشور في: (2019)

A new breakdown failure mechanism in HfO 2 gate dielectric
بواسطة: Ranjan, R., وآخرون
منشور في: (2014)

Inhibiting electro-thermal breakdown of acrylic dielectric elastomer actuators by dielectric gel coating
بواسطة: La, Thanh-Giang, وآخرون
منشور في: (2016)

Very high breakdown field strength for dielectric elastomer actuators quenched in dielectric liquid bath
بواسطة: La, Thanh-Giang, وآخرون
منشور في: (2014)

Simulation of post-breakdown transistor performance in ultrathin gate dielectrics-based nanoscale MOSFETs
بواسطة: Yaw, Meng Kwan.
منشور في: (2009)

Study of breakdown in ultrathin gate dielectrics in nanoscale MOSFETs
بواسطة: Lo, Vui Lip
منشور في: (2010)

Gate Dielectric-Breakdown-Induced Microstructural Damage in MOSFETs
بواسطة: Tang, L.J., وآخرون
منشور في: (2014)

GATE DIELECTRIC BREAKDOWN - 2D MODELING OF THE DBIE IMPACT ON THE DEVICE CHARACTERISTICS
بواسطة: CAO YU
منشور في: (2019)

Large axial actuation of pre-stretched tubular dielectric elastomer and use of oil encapsulation to enhance dielectric breakdown strength
بواسطة: Lau, Gih-Keong, وآخرون
منشور في: (2015)

Methods to prevent electrothermal breakdown of acrylic dielectric elastomer actuators
بواسطة: La, Thanh-Giang
منشور في: (2016)

Physical analysis on ultrathin gate dielectric breakdown using TEM
بواسطة: Tang, Lei Jun
منشور في: (2008)

Time dependent dielectric breakdown in copper low-k interconnects : mechanisms and reliability models
بواسطة: Wong, Terence Kin Shun
منشور في: (2013)

Evaluation of the dielectric breakdown of reoxidized nitrided oxide (ONO) in flash memory devices using constant current-stressing technique
بواسطة: Cha, C.L., وآخرون
منشور في: (2014)

IMD TDDB (TIME DEPENDENCE DIELECTRIC BREAKDOWN) ON LOW-k DIELETRICS
بواسطة: HANDRA
منشور في: (2019)

Effect of surface treatment on dielectric leakage and breakdown of copper damascene interconnects
بواسطة: Ngwan, V.C., وآخرون
منشور في: (2014)

Breakdown
بواسطة: Goh, Gabriel Issac, وآخرون
منشور في: (2018)

Digital breakdown and switching behaviours in high-K dielectrics in nano-scale mosfets
بواسطة: Liu, Wenhu.
منشور في: (2013)

Nanoscale characterization and analysis of localized degradation and breakdown of high-k dielectric stacks
بواسطة: Shubhakar.
منشور في: (2013)

Structural analysis of breakdown in ultrathin gate dielectrics using transmission electron microscopy
بواسطة: Pey, K.L., وآخرون
منشور في: (2014)

A numerical analysis of effects of vortex breakdown on oxygen transport in a micro-bioreactor
بواسطة: Yu, P., وآخرون
منشور في: (2014)

Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study
بواسطة: Zheng, Y., وآخرون
منشور في: (2014)

Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena
بواسطة: Pey, Kin Leong, وآخرون
منشور في: (2013)

The role of filler-epoxy interface and traps in the dielectric breakdown performance in epoxy moulding compounds (EMC)
بواسطة: Chua, Lin Xiao
منشور في: (2023)

Study of digital breakdown in pMOSFETs with ultrathin gate dielectric and its significance to reliability assessment
بواسطة: Ashwin Srinivas.
منشور في: (2010)

Atomistic simulation of EELS of SiON/Si interface and SiON breakdown
بواسطة: Wang, Zhongrui.
منشور في: (2009)

On the numerical technique for the simulation of hypervelocity test flows
بواسطة: Hu Z.M., وآخرون
منشور في: (2016)

Plasma etching optimization of oxide/nitride/oxide interpoly dielectric breakdown time in flash memory devices
بواسطة: Cha, C.L., وآخرون
منشور في: (2014)

Numerical simulation of oil spills and oil combating techniques
بواسطة: Tkalich, P.
منشور في: (2014)

Evidence of ultra-low-k dielectric material degradation and nanostructure alteration of the Cu/ultra-low-k interconnects in time-dependent dielectric breakdown failure
بواسطة: Lam, Jeffrey C. K., وآخرون
منشور في: (2013)

Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
بواسطة: Loh, W.Y., وآخرون
منشور في: (2014)

INFLUENCES OF FULLERENE ADDITION IN EPOXY RESIN FOR HIGH VOLTAGE INSULATION ON ELECTRIC BREAKDOWN STRENGTH AND ITS DIELECTRIC PROPERTIES
بواسطة: Agung Satria, Kristiawan

Failure mechanism analysis and process improvement on time-dependent dielectric breakdown of Cu/ultra-low-k dielectric based on complementary Raman and FTIR spectroscopy study
بواسطة: Wang, D.D, وآخرون
منشور في: (2020)

Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides
بواسطة: Palumbo, F., وآخرون
منشور في: (2014)

Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing
بواسطة: Loh, W.Y., وآخرون
منشور في: (2014)

Simulation of suppression of vortex breakdown over delta wings by vortex filament method
بواسطة: Lewpiriyawong Nuttawut.
منشور في: (2008)

Study of quasi-breakdown mechanism in ultra-thin gate oxide by using DCIV technique
بواسطة: Guan, Hao, وآخرون
منشور في: (2014)

A new modeling technique for mixed-mode simulation of CMOS circuits
بواسطة: Samudra, G., وآخرون
منشور في: (2014)

Size difference in dielectric-breakdown-induced epitaxy in narrow n- and p-metal oxide semiconductor field effect transistors
بواسطة: Pey, K.L., وآخرون
منشور في: (2014)

Modeling and numerical simulation of a brushless permanent-magnet DC motor in dynamic conditions by time-stepping technique
بواسطة: Jabbar, M.A., وآخرون
منشور في: (2014)