PEEC model for multiconductor systems including dielectric mesh

• Main Authors: Jayabalan, J., Ooi, B.L., Irene, A., Leong, M.S., Iyer, M.K.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Dielectric mesh; PEEC; Wafer level package test
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/71381
• Institution: National University of Singapore

10.1109/APMC.2005.1606378