Real-time estimation and control of photoresist properties in microlithography
10.1109/CCA.2007.4389313
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Main Authors: | Wu, X., Tay, A., Ho, W.K., Tan, K.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/71564 |
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Institution: | National University of Singapore |
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