Structural characterisation of polycrystalline SiGe thin film
10.1016/S0038-1101(01)00241-6
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Main Authors: | Teh, L.K., Choi, W.K., Bera, L.K., Chim, W.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83097 |
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Institution: | National University of Singapore |
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