Novel technique comprising silane treatment and laser anneal for abrupt ultra-shallow junction formation for InGaAs n-MOSFETs
10.1109/VLSI-TSA.2013.6545609
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Main Authors: | Kong, E., Gong, X., Guo, P., Liu, B., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/84023 |
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Institution: | National University of Singapore |
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