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by Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.
Published 2014
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by Ho, V., Tay, M.S., Moey, C.H., Teo, L.W., Choi, W.K., Chim, W.K., Heng, C.L., Lei, Y.
Published 2014
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Conference or Workshop Item
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by Teo, L.W., Heng, C.L., Ho, V., Tay, M., Choi, W.K., Chim, W.K., Antoniadis, D.A., Fitzgerald, E.A.
Published 2014
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Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structures
by Yue, J.M.P., Chim, W.K., Cho, B.J., Chan, D.S.H., Qin, W.H., Kim, Y.B., Jang, S.A., Yeo, I.S.
Published 2014
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Conference or Workshop Item