Risk factors for 3-year-mortality and a tool to screen patient in dialysis population

by Bujang, M. A., Kuan, P. X., Sapri, F. E., Liu, W. J., Musa, Ramli
Published 2019

A self-rectifying unipolar HfOx based RRAM using doped germanium bottom electrode

by Liu, W. J., Tran, Xuan Anh, Sun, Xiaowei, Yu, Hongyu
Published 2013

Automatic ontology construction for manufacturing knowledge and information management

by Hou, X., Liu, W.J., Ong, S.K., Nee, A.Y.C.
Published 2014

Understand NBTI mechanism by developing novel measurement techniques

by Li, M.-F., Huang, D., Shen, C., Yang, T., Liu, W.J., Liu, Z.
Published 2014

New insights of BTI degradation in MOSFETs with SiON gate dielectrics

by Li, M.-F., Huang, D., Liu, W.J., Liu, Z.Y., Huang, X.Y.
Published 2014

GRAONTO: A graph-based approach for automatic construction of domain ontology

by Hou, X., Ong, S.K., Nee, A.Y.C., Zhang, X.T., Liu, W.J.
Published 2014

Characteristics of a single-layer graphene field effect transistor with UV/ozone treatment

by Tran, Xuan Anh, Yu, Hongyu, Sun, Xiaowei, Liu, W. J., Liu, X. B., Wei, J.
Published 2013

A self-rectifying A1Oy bipolar RRAM with sub-50μA set/reset current for cross-bar architecture

by Liu, W. J., Yeo, Y. C., Nguyen, B. Y., Tran, Xuan Anh, Zhu, Wei, Yu, Hongyu
Published 2013

A self-rectifying alo y bipolar RRAM with sub-50μA set/reset current for cross-bar architecture

by Tran, X.A., Zhu, W., Liu, W.J., Yeo, Y.C., Nguyen, B.Y., Yu, H.Y.
Published 2014

Self-selection unipolar HfOx-Based RRAM

by Tran, X.A., Zhu, W., Liu, W.J., Yeo, Y.C., Nguyen, B.Y., Yu, H.Y.
Published 2014

Mechanism of different switching directions in graphene oxide based RRAM

by Wang, Zhongrui, Tjoa, Verawati, Wu, L., Liu, W. J., Fang, Z., Tran, Xuan Anh, Wei, J., Zhu, W. G., Yu, Hongyu
Published 2013

A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs

by Huang, D., Liu, W.J., Liu, Z.Y., Liao, C.C., Zhang, L.-F., Gan, Z., Wong, W., Li, M.-F.
Published 2014

Comprehensive studies of BTI effects in CMOSFETs with SiON by new measurement techniques

by Liu, Z.Y., Huang, D., Liu, W.J., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
Published 2014

Studies of NBTI in pMOSFETs with thermal and plasma nitrided SiON gate oxides by OFIT and FPM methods

by Liu, W.J., Huang, D., Sun, Q.Q., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
Published 2014

Highly uniform, self-compliance, and forming-free ALD HfO2-based RRAM with Ge doping

by Wu, L., Wang, Zhongrui, Zhu, W. G., Du, A. Y., Fang, Z., Tran, Xuan Anh, Liu, W. J., Zhang, K. L., Yu, Hongyu
Published 2013

Mutagenicity of polluted reservoir water and its reduction by a pilot-scale integrated biological treatment process

by Hu, J.Y., Ong, S.L., Ng, W.J., He, B.P., Liu, W.J., Fang, Z.D., Zhang, X.H., Wang, Z.S.
Published 2014

On-the-fly interface trap measurement and its impact on the understanding of NBTI mechanism for p-MOSFETs with SiON gate dielectric

by Liu, W.J., Liu, Z.Y., Huang, D., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Shen, C., Li, M.-F.
Published 2014

Vth shift in single-layer graphene field-effect transistors and its correlation with Raman inspection

by Wei, J., Liu, W. J., Fang, Z., Wang, Z. R., Wang, F., Wu, L., Zhang, J. F., Zhu, H. L., Sun, Xiaowei, Tran, Xuan Anh, Yu, Hongyu
Published 2013

A self-rectifying HfOx-based unipolar RRAM with NiSi electrode

by Tran, Xuan Anh, Gao, Bin, Yu, Hongyu, Zhu, W. G., Kang, J. F., Liu, W. J., Fang, Z., Wang, Z. R., Yeo, Y. C., Nguyen, B. Y., Li, M. F.
Published 2013

Positive bias-induced Vth instability in graphene field effect transistors

by Liu, W. J., Fang, Z., Wang, Z. R., Wang, F., Wu, L., Zhang, J. F., Wei, J., Zhu, H. L., Sun, Xiaowei, Tran, Xuan Anh, Ng, Geok Ing, Yu, Hongyu
Published 2013