Deep level effects on the characteristics of high electron mobility transistors grown by solid source MBE
This thesis presents the effect of deep levels on the performance of InxGa1-xP/In0.20Ga0.80As/GaAs and AlyGa1-yAs/In0.20Ga0.80As/GaAs pseudomorphic high electron mobility transistor (pHEMT) grown by solid source molecular beam epitaxy (SSMBE).
Saved in:
Main Author: | Yip, Kim Hong. |
---|---|
Other Authors: | Yoon, Soon Fatt |
Format: | Theses and Dissertations |
Published: |
2008
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/3902 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Similar Items
-
Characterization of InP based high electron mobility transistor structures grown by solid source MBE
by: Too, Patrick Heng Kwee.
Published: (2008) -
Realization of two dimensional electron gas in AlGaN/GaN HEMT structure grown on Si (111) by PA-MBE
by: Sun, Z. Z., et al.
Published: (2011) -
Ga-bilayer controlled AlGaN/GaN HEMT structure grown on Si by PA-MBE
by: Agrawal, M., et al.
Published: (2011) -
Monolithic integration of heterojunction bipolar transistors and high electron mobility transistors
by: Radhakrishnan, K., et al.
Published: (2008) -
Two-dimensional simulation and design of high electron mobility transistors
by: Kam, Adele Hwei Ting
Published: (2008)