Thin film characterizations for resistive memory
Resistive memory is currently one of the focused research topics in semiconductor and microelectronics research activities. Resistive memory has advantages of high density, 3-D architecture design, easy to fabrication, low-power use, non-volatile, and high expected performance. In this Final Year Pr...
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Main Author: | Weng, Bao Bin. |
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Other Authors: | Zhu Weiguang |
Format: | Final Year Project |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/49815 |
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Institution: | Nanyang Technological University |
Language: | English |
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