Single contact beam induced current phenomenon for microelectronic failure analysis

Single contact beam induced current phenomenon for microelectronic failure analysis

10.1016/S0026-2714(03)00280-4

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Bibliographic Details
Main Authors:	Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/50642
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Institution:	National University of Singapore

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