Evolution of quasi-breakdown in thin gate oxides

Evolution of quasi-breakdown in thin gate oxides

10.1063/1.1464648

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書目詳細資料
Main Authors:	Loh, W.Y., Cho, B.J., Li, M.F.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/55923
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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