Dynamic responses and solder joint reliability under board level drop test
10.1016/j.microrel.2006.05.012
Saved in:
Main Authors: | Luan, J.-e., Tee, T.Y., Pek, E., Lim, C.T., Zhong, Z. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/60012 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Novel numerical and experimental analysis of dynamic responses under board level drop test
by: Tee, T.Y., et al.
Published: (2014) -
Advanced numerical and experimental techniques for analysis of dynamic responses and solder joint reliability during drop impact
by: Luan, J.-E., et al.
Published: (2014) -
Study of PCB strains and component position under board level drop test
by: Ng, F.K., et al.
Published: (2014) -
Impact life prediction modeling of TFBGA packages under board level drop test
by: Tee, T.Y., et al.
Published: (2014) -
Board level drop test and simulation of TFBGA packages for telecommunication applications
by: Tee, T.Y., et al.
Published: (2014)