Advanced source/drain engineering for MOSFETs: Schottky barrier height tuning for contact resistance reduction
10.1149/1.3375592
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Main Author: | Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69243 |
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Institution: | National University of Singapore |
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