Effects of SiO2/Si3N4 hard masks on etching properties of metal gates
10.1116/1.2382950
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Main Authors: | Hwang, W.S., Cho, B.-J., Chan, D.S.H., Bliznetsov, V., Yoo, W.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82236 |
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Institution: | National University of Singapore |
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