Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si lines
10.1149/1.1473192
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Main Authors: | Lee, P.S., Pey, K.L., Mangelinck, D., Ding, J., Chi, D.Z., Dai, J.Y., Chan, L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82883 |
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Institution: | National University of Singapore |
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