Random telegraph signal noise in gate-all-around Si-FinFET with ultranarrow body

• Main Authors: Lim, Y.F., Xiong, Y.Z., Singh, N., Yang, R., Jiang, Y., Chan, D.S.H., Loh, W.Y., Bera, L.K., Lo, G.Q., Balasubramanian, N., Kwong, D.-L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: FinFET; Flicker (1/f) noise; Gate-all-around (GAA); Noise; Random telegraph signals (RTS)
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/82964
• Institution: National University of Singapore

10.1109/LED.2006.880640