The statistical distribution of percolation current for soft breakdown in ultrathin gate oxide
10.1109/LED.2003.812553
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Main Authors: | Lin, W.H., Pey, K.L., Dong, Z., Chooi, S.Y.M., Ang, C.H., Zheng, J.Z. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/92430 |
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Institution: | National University of Singapore |
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