Thermal stability of strained Si/Si1-xGex heterostructures for advanced microelectronics devices
10.1016/j.tsf.2004.05.050
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Main Authors: | Wong, L.H., Wong, C.C., Ong, K.K., Liu, J.P., Chan, L., Rao, R., Pey, K.L., Liu, L., Shen, Z.X. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/98370 |
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Institution: | National University of Singapore |
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