TSV-less 3D stacking of MEMS and CMOS via low temperature Al-Au direct bonding with simultaneous formation of hermetic seal

• المؤلفون الرئيسيون: Tan, Chuan Seng, Razzaq, A., Wee, K. H., Li, K. H., Yu, H., Chua, S. L.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2014
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/103614; http://hdl.handle.net/10220/24544
• المؤسسة: Nanyang Technological University

3D integration has been widely recognized as the next generation of technology for integrated microsystems with small form factor, high bandwidth, low power consumption, and possibility of heterogeneous More-than-Moore integration. Heterogeneous integration of MEMS and CMOS is critical in future dev...