Characterization and modeling of deep-submicron MOSFET's including frequency effects
This thesis presents the approaches to characterize the deep submicron-meter MOSFETs operating both in DC and in high frequency region. This thesis also conducts a comprehensive study and investigation on the high-frequency behaviours of the MOSFETs.
Saved in:
Main Author: | Wong, Jen Shuang. |
---|---|
Other Authors: | Ma, Jian-Guo |
Format: | Theses and Dissertations |
Published: |
2008
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/3746 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Similar Items
-
High frequency noise modeling of deep-submicron MOSFETs
by: Ong, Shih Ni
Published: (2015) -
Characterization of deep submicron MOSFET with ultra thin gate oxide
by: Sun, Quan.
Published: (2010) -
Predictive technology modeling for deep-submicron MOSFET design
by: Wang, Yuwen.
Published: (2008) -
Modeling of submicron MOSFETs
by: Chua, Ley Mui.
Published: (2009) -
Flicker noise fluctuations in deep submicron MOSFETs
by: Chew, Johnny Kok Wai
Published: (2010)