Fringing effect on the dielectric constant measurement: experiment and simulation
All major supply components such as transformers and cables need to be in kept in perfect operating condition. Their insulation must be able to withstand high voltages stresses. Hence, it is crucial that their conditions can be verified throughout their life cycle. The measurement of permit...
Saved in:
Main Author: | Tan, Yi Ling. |
---|---|
Other Authors: | Zhang Daming |
Format: | Final Year Project |
Language: | English |
Published: |
2011
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/45738 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Fringing effect on the measurement of permittivity of dielectric materials
by: Chen, Yi Quan.
Published: (2010) -
Analysis of high-dielectric constant gate stack reliability for nanoscale CMOS devices application via scanning tunneling microscopy
by: Ong, Yi Ching
Published: (2009) -
Dielectric properties of nanostructure
by: Huang, Sai Feng.
Published: (2010) -
Optimization of near-field scattering dielectric probe
by: Lim, Wei Wen
Published: (2010) -
Optical and dielectric properties of self-assembled germanium nanostructures and applications
by: Goh, Eunice Shing Mei.
Published: (2012)