Influence of cleaning process on gate oxide integrity
The influence of cleaning process on GOI (Gate Oxide Integrity) is studied in the whole FEOL (Front End Of the Line) process loop.
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Main Author: | Liu, Qing Guang. |
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Other Authors: | Prasad, Krishnamachar |
Format: | Theses and Dissertations |
Published: |
2008
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/4740 |
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Institution: | Nanyang Technological University |
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