Study on trapping effects in AlGaN/GaN-on-Si devices with vertical interconnect structures
10.1149/2.0131711jss
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Main Authors: | Chang, T.-F, Chang, C.-Y, Huang, C.-F, Liang, Y.C, Samudra, G.S, Lin, R.-M |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Editorial |
Published: |
Electrochemical Society
2020
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/183553 |
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