Two types of local oxide/substrate defects in very thin silicon dioxide films on silicon
10.1063/1.114807
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Main Authors: | Lau, W.S., Sane, V., Pey, K.S., Cronquist, B. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81314 |
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Institution: | National University of Singapore |
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