Lutetium oxide (Lu2O3) gate dielectric fabricated by pulsed laser deposition
The aim of this project is to investigate the suitability of rare-earth oxide as gate dielectric, in particular Lu2O3. There are three main chapters, in which the properties of Lu2O3 film, the effect of post-deposition treatments on Lu2O3 film as well as the properties of Lu2O3 on the next generatio...
Saved in:
Main Author: | Peter Darmawan |
---|---|
Other Authors: | Wang Shi Jie |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2010
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/38588 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Trap-controlled behavior in ultrathin Lu2O3 high-k gate dielectrics
by: Yuan, C. L., et al.
Published: (2013) -
Leakage conduction mechanism of amorphous Lu2O3 high-k dielectric films fabricated by pulsed laser ablation
by: Yuan, C. L., et al.
Published: (2013) -
Effect of low fluence laser annealing on ultrathin Lu2O3 high-k dielectric
by: Darmawan, P., et al.
Published: (2012) -
Novel high-k dielectrics for nanoelectronics
by: Chong, Vanessa Meng Meng
Published: (2016) -
Interface strain study of thin Lu2O3/Si using HRBS
by: Chan, T. K., et al.
Published: (2013)