Reliability of copper wire bonding
In this research, it is to investigate the reliability of the copper contact in chips to see if it is a viable possibility that it can replace gold bonding.
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Main Author: | Ang, Joash Wei Qiang |
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Other Authors: | Tang Xiaohong |
Format: | Final Year Project |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/50233 |
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Institution: | Nanyang Technological University |
Language: | English |
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