An in situ approach to real-time spatial control of steady-state wafer temperature during thermal processing in microlithography

10.1109/TSM.2007.890770

Saved in:
Bibliographic Details
Main Authors: Tay, A., Ho, W.K., Hu, N.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55029
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items