An in situ approach to real-time spatial control of steady-state wafer temperature during thermal processing in microlithography
10.1109/TSM.2007.890770
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Main Authors: | Tay, A., Ho, W.K., Hu, N. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55029 |
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Institution: | National University of Singapore |
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