Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

10.1109/TED.2004.833590

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書目詳細資料
Main Authors:	Hong, Y.D., Yeow, Y.T., Chim, W.-K., Wong, K.-M., Kopanski, J.J.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/56325
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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