Strain and materials engineering for the I-MOS transistor with an elevated impact-ionization region
10.1109/TED.2007.904988
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Main Authors: | Toh, E.-H., Wang, G.H., Chan, L., Lo, G.-Q., Samudra, G., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83074 |
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Institution: | National University of Singapore |
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